Serial Number:
88372785
Mark:
XENOCS XSACT
Status:
Registered
Status Date:
04-07-2020
Filing Date:
Registration Number:
6026814
Registration Date:
04-07-2020
Downloadable and recorded software for analyzing and identifying nanostructures, in particular size, configuration and orientation, or atomic-scale structures of soft matter or nanostructured materials, in particular polymers, surfactants, colloids, nanomaterials, porous materials, liquid crystals; Downloadable and recorded software for identifying characteristic dimensions on the atomic scale, the nanoscale or the mesoscale based on material analysis by means of small-angle X-ray scattering, ultra-small-angle X-ray scattering or wide-angle X-ray scattering; Downloadable and recorded software for processing X-ray scattering data collected by means of analyzing small-angle X-ray scattering, ultra-small-angle X-ray scattering or wide-angle X-ray scattering, and for visualizing data; Downloadable and recorded software for providing information relating to the size distribution of nanoparticles, relating to the size and configuration of nano-objects or nanoparticles in nanostructured materials, relating to fractal dimensions, relating to the crystalline proportion of semi-crystalline materials; Downloadable and recorded software for analyzing crystalline phases, nanoscale coatings for macromolecules in solutions, including proteins; Downloadable and recorded software for analyzing the orientation of nanostructures in thin films or deformed or stressed materials
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
01-21-2020
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
NOTARO, MICHALOS & ZACCARIA P.C.
Correspondent Name:
