XE-3DM
associated with 4 other trademarks
metrology instruments, namely, scanning probe microscopes and atomic force microscopes

Words that describe this trademark:

scanning probe microscopes  atomic force microscopes  metrology instruments  force  microscopes  instruments  probe 

Serial Number:

77245023

Mark:

XE-3DM

Status:

Abandoned-No Statement of Use filed

Status Date:

05-16-2011

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

metrology instruments, namely, scanning probe microscopes and atomic force microscopes

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

01-22-2008

Mark Drawing Status:

Standart Character Mark

Abandon Date:

05-16-2011

Business Name:

PATTERSON & SHERIDAN, L.L.P.

Correspondent Name:

Recent Trademark filings by this company