XACT
associated with 825 other trademarks
Semiconductor wafer inspection system used to inspect wafers for darkfield defects, including particles, scratches, and humps

Words that describe this trademark:

Serial Number:

98109935

Mark:

XACT

Status:

Non-final action-Mailed

Status Date:

04-09-2024

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Semiconductor wafer inspection system used to inspect wafers for darkfield defects, including particles, scratches, and humps

Mark Description:

N/A

Class:

Machines and machine tools

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

KILPATRICK TOWNSEND & STOCKTON LLP

Correspondent Name:

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