TRAJECTORY
associated with 76 other trademarks
Optical metrology apparatus for measurement of semiconductor wafers; optical metrology apparatus for integration with other process equipment for the ...

Words that describe this trademark:

optical metrology  semiconductor wafers  integration process  measurement  apparatus  wafers  metrology 

Serial Number:

85244592

Mark:

TRAJECTORY

Status:

Renewed

Status Date:

10-11-2022

Filing Date:

Registration Number:

4140065

Registration Date:

05-08-2012

Goods and Services:

Optical metrology apparatus for measurement of semiconductor wafers; optical metrology apparatus for integration with other process equipment for the measurement of semiconductor wafers

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

06-28-2011

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

GORNITZKY & CO

Correspondent Name:

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