Serial Number:
76303604
Mark:
TNK
Status:
Abandoned-No Statement of Use filed
Status Date:
11-15-2002
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
Metrology instrument, namely, apparatus for measuring thickness and/or optical properties of films on samples
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
02-19-2002
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
11-15-2002
Business Name:
NANOMETRICS, INCORPORATED
Correspondent Name: