Serial Number:
78423564
Mark:
TFPROBE
Status:
Cancelled-Section 8
Status Date:
10-12-2012
Filing Date:
Registration Number:
2956286
Registration Date:
05-24-2005
THIN FILM THICKNESS MEASUREMENT SYSTEM COMPRISED OF A SPECTROPHOTOMETER, MICROSPECTROPHOTOMETFR, NANOSPECTROPHOTOMETER, SPECTROMETER, REFLECTOMETER, ELLIPSOMETER, SPECTROSCOPIC ELLIPSOMETER; MICROSCOPE, IMAGING SYSTEM, MONOCHROMATOR, AND SOFTWARE FOR DATA ACQUISITION, SIMULATION AND REGRESSION PROVIDED THEREWITH; STRESS MEASUREMENT SYSTEM COMPRISED OF LASER BEAMS, MOTOR CONTROLLERS AND SOFTWARE FOR DATA ACQUISITION, SIMULATION AND REGRESSION PROVIDED THEREWITH
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
N/A
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
DAY LAW FIRM
Correspondent Name:
