SOURCE METROLOGY INSTRUMENT (SMI)
associated with 22 other trademarks
Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data re...

Words that describe this trademark:

semiconductor industry  computer software  analyzing data  optical instruments  instruments  comprised  industry  apparatus  components  software 

Serial Number:

76574016

Mark:

SOURCE METROLOGY INSTRUMENT (SMI)

Status:

Cancelled-Section 8

Status Date:

01-11-2013

Filing Date:

Registration Number:

3101233

Registration Date:

06-06-2006

Goods and Services:

Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and in-situ imaging objectives of the pinhole, refractive or reflective kind, in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

06-21-2005

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

N/A

Correspondent Name:

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