SHAPESHIFT
associated with 91 other trademarks
Downloadable computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics ...

Words that describe this trademark:

semiconductor integrated circuit  software process control  process control  computer software  integrated circuit  yield management  related  circuit  control  management 

Serial Number:

88462960

Mark:

SHAPESHIFT

Status:

Abandoned-No Statement of Use filed

Status Date:

07-27-2020

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Downloadable computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; downloadable computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; downloadable computer software for providing analytic data on the performance of inspection and metrology tools; downloadable computer software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; downloadable computer software used for event prediction in the manufacturing of semiconductors and integrated circuits; downloadable computer software for use in detecting defective semiconductor electronic components; Computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries recorded on computer media; computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks recorded on computer media; computer software for providing analytic data on the performance of inspection and metrology tools recorded on computer media; computer software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes recorded on computer media; computer software used for event prediction in the manufacturing of semiconductors and integrated circuits recorded on computer media; computer software for use in detecting defective semiconductor electronic components recorded on computer media

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

10-29-2019

Mark Drawing Status:

Standart Character Mark

Abandon Date:

07-27-2020

Business Name:

SHEPPARD MULLIN RICHTER & HAMPTON LLP

Correspondent Name:

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