SCIOS
associated with 30 other trademarks
high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion be...

Words that describe this trademark:

field emission  electron beam  high brightness  ion electron  emission technology  beam columns  using  submicron  columns  brightness 

Serial Number:

88222800

Mark:

SCIOS

Status:

Registered

Status Date:

07-02-2019

Filing Date:

Registration Number:

5794380

Registration Date:

07-02-2019

Goods and Services:

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

04-16-2019

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

THERMO FISHER SCIENTIFIC

Correspondent Name:

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