PARK SYSTEMS
associated with 4 other trademarks
instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning probe microscopes and atomic force microscopes

Words that describe this trademark:

scanning probe microscopes  atomic force microscopes  instruments  microscopes  carrying  probe  microscale  analyses  measurements  nanoscale 

Serial Number:

77245006

Mark:

PARK SYSTEMS

Status:

Renewed

Status Date:

09-12-2018

Filing Date:

Registration Number:

3494880

Registration Date:

09-02-2008

Goods and Services:

instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning probe microscopes and atomic force microscopes

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

06-17-2008

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

PATTERSON & SHERIDAN, LLP

Correspondent Name:

Recent Trademark filings by this company