OPTIVIEW
By: LUXTRON CORPORATION
associated with 6 other trademarks
computer software for detecting the endpoint of a semiconductor wafer manufacturing process and controlling that process

Words that describe this trademark:

wafer manufacturing process  computer software  manufacturing process  process controlling  controlling process  semiconductor wafer  process  software  endpoint  detecting 

Serial Number:

75327714

Mark:

OPTIVIEW

Status:

Cancelled-Section 8

Status Date:

04-22-2006

Filing Date:

Registration Number:

2263586

Registration Date:

07-20-1999

Goods and Services:

computer software for detecting the endpoint of a semiconductor wafer manufacturing process and controlling that process

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

05-19-1998

Owner:

Mark Drawing Status:

5S05

Abandon Date:

N/A

Business Name:

PARSONS HSUE & DE RUNTZ LLP

Correspondent Name:

Recent Trademark filings by this company