Serial Number:
76442279
Mark:
NANOUDI
Status:
Abandoned-No Statement of Use filed
Status Date:
01-09-2004
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
Metrology system for the detection and measurement of particles and defects comprised principally of low distortion optics, a high intensity broadband light source, high resolution detector, and image processing and defect detection software, that enables inspection of both the front and backside of a sample, particularly, a semiconductor wafer, mask, flat panel display, or magnetic substrate
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
04-15-2003
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
01-09-2004
Business Name:
NANOMETRICS INC.
Correspondent Name:
