NANOSTANDARD
associated with 41 other trademarks
Semiconductor wafer gauge structures having known dimensional properties to be used in place of semiconductor wafers for the purpose of calibrating se...

Words that describe this trademark:

dimensional properties  used place  semiconductor wafer  having known  properties  wafer  gauge  structures  known  place 

Serial Number:

76342051

Mark:

NANOSTANDARD

Status:

Abandoned-Failure to Respond

Status Date:

05-30-2003

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Semiconductor wafer gauge structures having known dimensional properties to be used in place of semiconductor wafers for the purpose of calibrating semiconductor wafer non-contact dimensional measurement devices

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Mark Drawing Status:

Typed Drawing

Abandon Date:

04-19-2003

Business Name:

WEINGARTEN, SCHURGIN, GAGNEBIN

Correspondent Name:

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