Serial Number:
75446145
Mark:
NANOMETRA
Status:
Abandoned-No Statement of Use filed
Status Date:
08-02-2000
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
Scientific instrument for metrology applications, namely, a metrology unit which is used to measure the critical dimensions and overlay registration achieved in submicron optical lithography
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
11-09-1999
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
08-02-2000
Business Name:
NANOMETRICS INC
Correspondent Name:
