NANODUE'T
associated with 25 other trademarks
Scanning electron microscopes; scanning transmission electron microscopes; Focused ion beam system for the design, inspection and manufacture of semic...

Words that describe this trademark:

ion beam system  focused ion beam  scanning electron microscopes  transmission electron microscopes  electron microscopes  scanning transmission  beam system  microscopes 

Serial Number:

78849978

Mark:

NANODUE'T

Status:

Cancelled-Section 8

Status Date:

11-12-2021

Filing Date:

Registration Number:

3935753

Registration Date:

03-22-2011

Goods and Services:

Scanning electron microscopes; scanning transmission electron microscopes; Focused ion beam system for the design, inspection and manufacture of semiconductors; compatible specimen holders for scanning electron microscopes, scanning transmission electron microscopes, scanning transmission electron microscopes, and focused ion beam systems; electronic devices to integrate focused ion beam systems with a scanning transmission electron microscope or a transmission electron microscope for the design, inspection and manufacture of semiconductors

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

09-25-2007

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

LEWIS BRISBOIS BISGAARD & SMITH LLP

Correspondent Name:

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