NANOCD
By: NANOMETRICS INCORPORATED
associated with 24 other trademarks
Metrology instrument utilizing an optical technique for measuring microscopic features on samples, such as semiconductor wafers, flat panel displays a...

Words that describe this trademark:

semiconductor wafers  microscopic features  metrology instrument  optical technique  measuring  features  utilizing  samples  instrument  technique 

Serial Number:

76317801

Mark:

NANOCD

Status:

Abandoned-No Statement of Use filed

Status Date:

02-28-2003

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Metrology instrument utilizing an optical technique for measuring microscopic features on samples, such as semiconductor wafers, flat panel displays and magnetic media

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

06-04-2002

Owner:

Mark Drawing Status:

Typed Drawing

Abandon Date:

02-28-2003

Business Name:

NANOMETRICS INDORPORATED

Correspondent Name:

Recent Trademark filings by this company