Serial Number:
76613111
Mark:
N,K EXPERT
Status:
Abandoned-Failure to Respond
Status Date:
11-25-2005
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
software expert system for the automatic analysis of optical data, e;g;, reflectometry, ellipsometry, scatterometry, or any combination thereof, to determine film thicknesses and/or optical constants of materials; It is applicable to single films or multiple-film stacks on any sample
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
N/A
Owner:
Mark Drawing Status:
Words, Letters, and/or Numbers in Stylized From
Abandon Date:
10-31-2005
Business Name:
NANOMETRICS, INCORPORATED
Correspondent Name:
