Serial Number:
75593732
Mark:
MIGHTYSPEC
Status:
Abandoned-No Statement of Use filed
Status Date:
06-29-2000
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
A metrology tool for measuring the thickness, and analyzing the composition of certain films such as, but not limited to, polycrystalline films deposited on substrates including, but not limited to, semiconductor wafers, flat panel display substrates and magnetic head substrates, such film properties are determined by various methods such as, but not limited to, reflectometry, ellipsometry and interferometry
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
10-05-1999
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
06-29-2000
Business Name:
NANOMETRICS INC.
Correspondent Name:
