MICROMILL
associated with 2 other trademarks
focused ion beam instruments for imaging, for material removal, and for material deposition; ion sources for focused ion beam instruments; and compute...

Words that describe this trademark:

focused ion beam  removal material  ion beam  material deposition  material removal  ion sources  beam  imaging  instruments  deposition 

Serial Number:

75255610

Mark:

MICROMILL

Status:

Cancelled-Section 8

Status Date:

03-10-2007

Filing Date:

Registration Number:

2355600

Registration Date:

06-06-2000

Goods and Services:

focused ion beam instruments for imaging, for material removal, and for material deposition; ion sources for focused ion beam instruments; and computer software for use with the foregoing goods; focused energy beam machines and instruments for cutting and forming materials installation, repair, and maintenance of focused beam instruments and of ion sources installation, repair, and maintenance of computer software

Mark Description:

N/A

Class:

Scientific and technological services

Type of Mark:

Trademark

Published for Opposition Date:

07-14-1998

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

LAHIVE & COCKFIELD LLP

Correspondent Name:

Recent Trademark filings by this company