Serial Number:
76675858
Mark:
MICROLINE
Status:
Renewed
Status Date:
06-28-2018
Filing Date:
Registration Number:
3482795
Registration Date:
08-12-2008
An optical metrology system for nanometrology comprised of a light source, a camera and sensors in communication with computer software and hardware, for non-contact dimensional measurement of semiconductor wafers, micro electo-mechanical systems and micro-fabricated electronic assemblies
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
05-27-2008
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
HARTER SECREST & EMERY LLP
Correspondent Name:
