METROTOOLS
associated with 41 other trademarks
Software for use in measuring thickness of substrates, particularly semiconductor wafers, and more particularly backgrind characterization, film thick...

Words that describe this trademark:

software measuring  semiconductor wafers  measuring thickness  wafers  particularly  substrates  thickness  characterization  backgrind 

Serial Number:

75456783

Mark:

METROTOOLS

Status:

Cancelled-Section 8

Status Date:

10-14-2006

Filing Date:

Registration Number:

2307924

Registration Date:

01-11-2000

Goods and Services:

Software for use in measuring thickness of substrates, particularly semiconductor wafers, and more particularly backgrind characterization, film thickness, measurement and shape differencing

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

03-16-1999

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

WEINGARTEN SCHURGIN GAGNEBIN & HAYES

Correspondent Name:

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