Serial Number:
75542214
Mark:
METRASPEC
Status:
Abandoned-No Statement of Use filed
Status Date:
05-24-2000
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
scientific measuring instrument used to measure critical dimensions, lithography overlay registration, film thickness, and analysis of film composition during microelectronics manufacturing such as the production of integrated circuits
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
08-31-1999
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
05-24-2000
Business Name:
NANOMETRICS INC
Correspondent Name:
