MC2000
associated with 42 other trademarks
AUTOMATED SUBSTRATE AND WAFER BUMP INSPECTION SYSTEMS, COMPRISING A LOADER, AN INSPECTION UNIT, A SORTING UNIT, AN UNLOADER AND A SYSTEM CONTROLLER

Words that describe this trademark:

wafer bump  inspection systems  bump inspection  substrate wafer  unit  inspection  systems  automated  comprising  loader 

Serial Number:

75782151

Mark:

MC2000

Status:

Abandoned-No Statement of Use filed

Status Date:

09-05-2003

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

AUTOMATED SUBSTRATE AND WAFER BUMP INSPECTION SYSTEMS, COMPRISING A LOADER, AN INSPECTION UNIT, A SORTING UNIT, AN UNLOADER AND A SYSTEM CONTROLLER

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

03-28-2000

Mark Drawing Status:

Typed Drawing

Abandon Date:

09-05-2003

Business Name:

KENYON & KENYON

Correspondent Name:

Recent Trademark filings by this company