Serial Number:
78455256
Mark:
JVX
Status:
Renewed
Status Date:
12-17-2015
Filing Date:
Registration Number:
3027570
Registration Date:
12-13-2005
Instruments for analysis of materials and for characterization and metrology of thin films, namely, instruments based on X-rays, and software for operating such instruments
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
09-20-2005
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
D. KLIGLER IP SERVICES LTD.
Correspondent Name:
