Serial Number:
79031217
Mark:
JANUS
Status:
Status Date:
08-05-2016
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
Optical measuring devices, in particular measuring devices for examining electronic components, such as semiconductor wafers, optical defect inspection devices for the detection of particles, micro-surface roughness and surface defects, optical layer thickness measuring devices for the layer thickness measurement of transparent layers, such as laser ellipsometers; combined optical measuring devices, in particular combined defect inspection devices and layer thickness measuring devices
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
N/A
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
08-05-2016
Business Name:
FUCHS MEHLER WEISS & FRITZSCHE
Correspondent Name:
