IRIS
By: ONTO INNOVATION INC.
associated with 76 other trademarks
Automated system comprising a broad band spectroscopic ellipsometer and reflectometer for use in measuring thin film thickness of dielectric coatings ...

Words that describe this trademark:

thin film thickness  used measure  critical dimensions  film thickness  automated system  dielectric coatings  thickness  system  measure  coatings 

Serial Number:

90479624

Mark:

IRIS

Status:

Registered

Status Date:

09-03-2024

Filing Date:

Registration Number:

7495689

Registration Date:

09-03-2024

Goods and Services:

Automated system comprising a broad band spectroscopic ellipsometer and reflectometer for use in measuring thin film thickness of dielectric coatings and critical dimensions in the production and fabrication of microscopic and nano-scale devices

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

04-04-2023

Owner:

Mark Drawing Status:

4

Abandon Date:

N/A

Business Name:

P.O. BOX 2910

Correspondent Name:

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