INTOOL
associated with 24 other trademarks
Metrology and inspection systems for integration into semiconductor wafer, magnetic read-write head, and flat panel display processing and related equ...

Words that describe this trademark:

flat panel display  semiconductor wafer  metrology inspection  systems integration  head flat  inspection systems  wafer  readwrite  integration  magnetic 

Serial Number:

75702212

Mark:

INTOOL

Status:

Abandoned-Failure to Respond

Status Date:

07-21-2000

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Metrology and inspection systems for integration into semiconductor wafer, magnetic read-write head, and flat panel display processing and related equipment; such as, but not limited to, chemical mechanical polishers, chemical vapor deposition reactors, physical vapor deposition reactors, rapid thermal processors, wet and dry etchers, epitaxial reactors, ion implanters, material handlers, lithography track and exposure systems, and assemblies thereof

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Mark Drawing Status:

Typed Drawing

Abandon Date:

04-10-2000

Business Name:

NANOMETRICS INC

Correspondent Name:

Recent Trademark filings by this company