IMPACT
By: KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES
associated with 25 other trademarks
Comprehensive preventative maintenance services for critical dimension-scanning electron microscopes, maintenance services for critical dimension-scan...

Words that describe this trademark:

electron microscopes  maintenance maintenance  preventative maintenance  maintenance  microscopes  critical 

Serial Number:

87345035

Mark:

IMPACT

Status:

Registered

Status Date:

11-13-2018

Filing Date:

Registration Number:

5604129

Registration Date:

11-13-2018

Goods and Services:

Comprehensive preventative maintenance services for critical dimension-scanning electron microscopes, maintenance services for critical dimension-scanning electron microscopes

Mark Description:

N/A

Class:

Building construction

Type of Mark:

Servicemark

Published for Opposition Date:

08-28-2018

Owner:

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

LEWIS BRISBOIS BISGAARD & SMITH LLP

Correspondent Name:

Recent Trademark filings by this company