HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI).
associated with 22 other trademarks
Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data re...

Words that describe this trademark:

computer software  analyzing data  optical instruments  semiconductor industry  components  software  instruments  comprised  industry  apparatus 

Serial Number:

76587121

Mark:

HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI).

Status:

Cancelled-Section 8

Status Date:

03-08-2013

Filing Date:

Registration Number:

3124041

Registration Date:

08-01-2006

Goods and Services:

Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and an in-situ imaging objective with mounting means attached to a framework in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the sufraces of wafers for use in manufacturing of integrated circuits

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

09-13-2005

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

N/A

Correspondent Name:

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