Serial Number:
76587121
Mark:
HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI).
Status:
Cancelled-Section 8
Status Date:
03-08-2013
Filing Date:
Registration Number:
3124041
Registration Date:
08-01-2006
Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and an in-situ imaging objective with mounting means attached to a framework in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the sufraces of wafers for use in manufacturing of integrated circuits
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
09-13-2005
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
N/A
Correspondent Name: