FS
associated with 70 other trademarks
AUTOMATED WAFER INSPECTION SYSTEMS COMPRISED OF COMPUTER HARDWARE, MICROSCOPES, SOFTWARE FOR USE IN THE INSPECTION OF WAFERS, LOADING PORTS, INSPECTIO...

Words that describe this trademark:

wafer inspection systems  software inspection  computer hardware  inspection systems  hardware  microscopes  systems  inspection  comprised  automated 

Serial Number:

76378619

Mark:

FS

Status:

Abandoned-No Statement of Use filed

Status Date:

05-07-2006

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

AUTOMATED WAFER INSPECTION SYSTEMS COMPRISED OF COMPUTER HARDWARE, MICROSCOPES, SOFTWARE FOR USE IN THE INSPECTION OF WAFERS, LOADING PORTS, INSPECTION PLATFORMS, AND A WAFER TRANSFERRING UNIT

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

02-11-2003

Mark Drawing Status:

Typed Drawing

Abandon Date:

05-07-2006

Business Name:

KENYON & KENYON

Correspondent Name:

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