FEI
associated with 30 other trademarks
high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion be...

Words that describe this trademark:

electron beam  high brightness  ion electron  emission technology  beam columns  field emission  columns  brightness  using  submicron 

Serial Number:

75296464

Mark:

FEI

Status:

Cancelled-Section 8

Status Date:

10-29-2021

Filing Date:

Registration Number:

2263534

Registration Date:

07-20-1999

Goods and Services:

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, focused electron beam columns for electron beam lithography, and electron beam microscopy; single crystal source materials, namely, refractory metals, LaB6 mini-vogel cathodes, CeB6 mini-vogel mount cathodes, control grid electrodes, namely, rebuilt wehnelts; cold field emitters, schottky emitters, and liquid metal ion sources

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

07-28-1998

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

STOEL RIVES LLP

Correspondent Name:

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