FEI
associated with 30 other trademarks
high brightness, submicron focused ion and electron beam systems using field emission technology; namely, for ion beam micromachining, ion milling, io...

Words that describe this trademark:

electron beam  high brightness  ion electron  field emission  beam systems  using  brightness  systems  focused  submicron 

Serial Number:

74123931

Mark:

FEI

Status:

Cancelled-Section 8

Status Date:

01-29-2016

Filing Date:

Registration Number:

1681042

Registration Date:

03-31-1992

Goods and Services:

high brightness, submicron focused ion and electron beam systems using field emission technology; namely, for ion beam micromachining, ion milling, ion lithography, ion microscopes, secondary ion mass spectroscopy, electron microscopes and combined ion beam milling/electron microscope systems; high brightness, submicron ion and electron beam columns using field emission technology; namely, ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, electron beam lithography, and electron beam microscopy; single crystal source materials; namely, refractory metals, LaB6 Mini-Vogel Mount cathodes, cold field emitters, Schottky emitters, and liquid metal ion sources

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

01-07-1992

Mark Drawing Status:

5S23

Abandon Date:

N/A

Business Name:

STOEL RIVES LLP

Correspondent Name:

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