FEI BEAM TECHNOLOGY
associated with 31 other trademarks
HIGH BRIGHTNESS, SUBMICRON ION AND ELECTRON BEAM COLUMNS USING FIELD EMISSION TECHNOLOGY; NAMELY, FOCUSED ION BEAM COLUMNS FOR ION LITHOGRAPHY, ION BE...

Words that describe this trademark:

beam columns  field emission  electron beam  high brightness  ion electron  emission technology  brightness  using  submicron  columns 

Serial Number:

75602078

Mark:

FEI BEAM TECHNOLOGY

Status:

Cancelled-Section 8

Status Date:

12-16-2006

Filing Date:

Registration Number:

2328675

Registration Date:

03-14-2000

Goods and Services:

HIGH BRIGHTNESS, SUBMICRON ION AND ELECTRON BEAM COLUMNS USING FIELD EMISSION TECHNOLOGY; NAMELY, FOCUSED ION BEAM COLUMNS FOR ION LITHOGRAPHY, ION BEAM MILLING, SECONDARY ION MASS SPECTROSCOPY, FOCUSED ELECTRON BEAM COLUMNS FOR ELECTRON BEAM LITHOGRAPHY, AND ELECTRON BEAM MICROSCOPY; SINGLE CRYSTAL SOURCE MATERIALS; NAMELY, REFRACTORY METALS, LaB6 MINI-VOGEL MOUNT CATHODES, CeB6 MINI-VOGEL MOUNT CATHODES, WEHNELT REBUILDING SERVICE, COLD FIELD EMITTERS, SCHOTTKY EMITTERS, AND LIQUID METAL ION SOURCES

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

12-21-1999

Mark Drawing Status:

5R21

Abandon Date:

N/A

Business Name:

STOEL RIVES LLP

Correspondent Name:

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