Serial Number:
78678046
Mark:
EXTREME METROLOGY AT THE NANO-SCALE
Status:
Cancelled-Section 8
Status Date:
03-08-2013
Filing Date:
Registration Number:
3125190
Registration Date:
08-01-2006
Atomic, molecular, chemical, and structural analyses of materials for others; technical support, analysis, testing, consultation, and design services for scientific, electrical, optical, measuring, laboratory and test apparatus and instruments, and computer hardware and software used in connection therewith; scientific and technological research and development services for others in the fields of scientific, electrical, optical, measuring, laboratory, and test apparatus and instruments, and computer and hardware software used in connection therewith; technical support services, namely, monitoring and troubleshooting of scientific, electrical, optical, measuring, laboratory, and test apparatus and instruments, and computer hardware and software used in connection therewith
Mark Description:
N/A
Class:
Scientific and technological services
Type of Mark:
Servicemark
Published for Opposition Date:
N/A
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
PERKINS COIE LLP
Correspondent Name:
