EXCELLENCE IN NANOMETROLOGY
By: PARK SYSTEMS CORP.
associated with 4 other trademarks
instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning probe microscopes and atomic force microscopes

Words that describe this trademark:

scanning probe microscopes  atomic force microscopes  analyses  measurements  nanoscale  instruments  microscopes  carrying  probe  microscale 

Serial Number:

77245031

Mark:

EXCELLENCE IN NANOMETROLOGY

Status:

Cancelled-Section 8

Status Date:

01-23-2015

Filing Date:

Registration Number:

3451584

Registration Date:

06-17-2008

Goods and Services:

instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning probe microscopes and atomic force microscopes

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Owner:

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

PATTERSON & SHERIDAN, L.L.P.

Correspondent Name:

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