EPIC
By: NANOMETRICS INCORPORATED
associated with 24 other trademarks
metrology system for the analysis and determination of properties such as thickness and optical constants of films on samples such as semiconductor wa...

Words that describe this trademark:

metrology system  system analysis  films samples  analysis determination  optical constants  constants  samples  properties  determination  thickness 

Serial Number:

75486723

Mark:

EPIC

Status:

Abandoned-Failure to Respond

Status Date:

02-29-2000

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

metrology system for the analysis and determination of properties such as thickness and optical constants of films on samples such as semiconductor wafers using different optical technologies for film analysis such as Fourier Transform Infrared (FTIR), visible and ultraviolet (UV) reflectometry

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Owner:

Mark Drawing Status:

Typed Drawing

Abandon Date:

11-15-1999

Business Name:

NANOMETRICS

Correspondent Name:

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