ELEMENT
associated with 76 other trademarks
Fourier transform infrared system for determining the composition and quality of semiconductor substrates, namely, semiconductor testing apparatus

Words that describe this trademark:

fourier transform infrared  quality semiconductor  infrared system  semiconductor  system  substrates  transform  composition  determining 

Serial Number:

90004454

Mark:

ELEMENT

Status:

Report completed suspension check-Case still suspended

Status Date:

11-20-2024

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Fourier transform infrared system for determining the composition and quality of semiconductor substrates, namely, semiconductor testing apparatus

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Mark Drawing Status:

4

Abandon Date:

N/A

Business Name:

P.O. BOX 2910

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