E-SQUARED
associated with 62 other trademarks
Apparatus for measurement of silicon wafer thickness, flatness and shape

Words that describe this trademark:

silicon wafer thickness  wafer thickness  thickness  flatness  measurement  apparatus  shape 

Serial Number:

76327744

Mark:

E-SQUARED

Status:

Cancelled-Section 8

Status Date:

03-22-2013

Filing Date:

Registration Number:

2609693

Registration Date:

08-20-2002

Goods and Services:

Apparatus for measurement of silicon wafer thickness, flatness and shape

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

05-28-2002

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

HELLER EHRMAN LLP

Correspondent Name:

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