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Showing 1-8 of 8 results
Mark Name
Mark Description
NANOMORPHOLOGY
Owned by:
ADE CORPORATION
Filed on: 05-12-1999
Status:
Abandoned-After ex parte ...
NON-CONTACT SUBSTRATE SURFACE DIMENSION MEASUREMENT HARDWARE AND ASSOCIATED DATA ANALYSIS SOFTWARE FOR PROCESSING SUBSTRATE DATA, PARTICULARLY S
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NANOMETROLOGY
Owned by:
ADE CORPORATION
Filed on: 05-12-1999
Status:
Abandoned-Failure to Resp...
NON-CONTACT OPTICAL IMAGING HARDWARE AND ASSOCIATED SOFTWARE FOR CHARACTERIZING THE SURFACE OF A SUBSTRATE SUCH AS A SEMICONDUCTOR WAFER
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MICROSORT
Owned by:
ADE CORPORATION
Filed on: 01-03-1980
Status:
Cancelled-Section 8
Non-Contact Apparatus for Electronically Sorting and Gauging the Thickness and Resistivity of Semi-Conductor Substrates
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NANOSENSE
Owned by:
ADE CORPORATION
Filed on: 05-12-1999
Status:
Abandoned-No Statement of...
non-contact substrate surface dimension measurement hardware and associated data analysis software for processing substrate data, particularly s
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NANOFLATNESS
Owned by:
ADE CORPORATION
Filed on: 05-12-1999
Status:
Abandoned-No Statement of...
NON-CONTACT SUBSTRATE SURFACE GAUGE AND COMPUTER SOFTWARE OPERATIVE THEREWITH FOR SUBSTRATE SURFACE PROFILING IN THE SEMICONDUCTOR INDUSTRY
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NANOFLAT
Owned by:
ADE CORPORATION
Filed on: 05-12-1999
Status:
Abandoned-No Statement of...
NON-CONTACT SUBSTRATE SURFACE DIMENSION MEASUREMENT HARDWARE AND ASSOCIATED DATA ANALYSIS SOFTWARE FOR PROCESSING SUBSTRATE DATA, PARTICULARLY S
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NANOTOPOLOGY
Owned by:
ADE CORPORATION
Filed on: 05-12-1999
Status:
Abandoned-After ex parte ...
NON-CONTACT OPTICAL IMAGING HARDWARE AND ASSOCIATED SOFTWARE FOR CHARACTERIZING THE SURFACE OF A SUBSTRATE SUCH AS A SEMI-CONDUCTOR WAFER
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DCS-II
Owned by:
ADE CORPORATION
Filed on: 03-26-1998
Status:
Abandoned-No Statement of...
system comprising computer interface hardware and computer software for non-contact inspection and data analysis, particularly for the inspectio
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