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Showing 1-8 of 8 results
Mark Name
Mark Description
WAFERWORX
Owned by:
ONTO INNOVATION...
Filed on: 08-28-2000
Status:
Cancelled-Section 8
process control system comprised of data analysis software, and imaging and inspection hardware and software used for quality control analysis o
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RUDOLPH
Owned by:
ONTO INNOVATION...
Filed on: 03-11-2022
Status:
Third Extension-Granted
Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in
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RUDOLPH
Owned by:
ONTO INNOVATION...
Filed on: 05-24-2007
Status:
Renewed
METROLOGY INSPECTION SYSTEMS COMPRISED OF ONE OR MORE LIGHT SOURCES, ONE OR MORE CAMERAS AND/OR SENSORS IN COMMUNICATION WITH COMPUTER SOFTWARE
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RUDOLPH
Owned by:
ONTO INNOVATION...
Filed on: 05-24-2007
Status:
Renewed
METROLOGY INSPECTION SYSTEMS COMPRISED OF ONE OR MORE LIGHT SOURCES, ONE OR MORE CAMERAS AND/OR SENSORS IN COMMUNICATION WITH COMPUTER SOFTWARE
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ASPECT
Owned by:
ONTO INNOVATION...
Filed on: 03-30-2020
Status:
Registered
Electronic instruments for use in inspection and measurement of industrial components, namely, an automated substrate metrology device comprised
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ECHO
Owned by:
ONTO INNOVATION...
Filed on: 01-06-2021
Status:
Report completed suspensi...
Picosecond optoacoustic system comprised of machines, components and operating software for characterizing thickness and material properties of semico
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NANOMETRICS
Owned by:
ONTO INNOVATION...
Filed on: 03-11-2022
Status:
First Extension-Granted
Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in
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NANOSTATION
Owned by:
ONTO INNOVATION...
Filed on: 11-14-2007
Status:
Renewed
Advanced multi-core computer system comprised of computer software and computer hardware for modeling complex grating structures used to measure
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