Serial Number:
79354003
Mark:
BASIC
Status:
Registered
Status Date:
01-09-2024
Filing Date:
Registration Number:
7265407
Registration Date:
01-09-2024
Semiconductor photomask optical inspection apparatus; semiconductor photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor photomask pattern; semiconductor reticle optical inspection apparatus; semiconductor reticle pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor reticle pattern Defect repair machines for photomasks for semiconductors; defect repair machines for reticles for semiconductors; foreign matter removal machines for photomasks for semiconductors; foreign matter removal machines for reticles for semiconductors
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
10-24-2023
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
WHDA, LLP
Correspondent Name: