BASIC
associated with 7 other trademarks
Semiconductor photomask optical inspection apparatus; semiconductor photomask pattern measuring apparatus, namely, optical measurement system comprise...

Words that describe this trademark:

Serial Number:

79354003

Mark:

BASIC

Status:

Registered

Status Date:

01-09-2024

Filing Date:

Registration Number:

7265407

Registration Date:

01-09-2024

Goods and Services:

Semiconductor photomask optical inspection apparatus; semiconductor photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor photomask pattern; semiconductor reticle optical inspection apparatus; semiconductor reticle pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor reticle pattern Defect repair machines for photomasks for semiconductors; defect repair machines for reticles for semiconductors; foreign matter removal machines for photomasks for semiconductors; foreign matter removal machines for reticles for semiconductors

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

10-24-2023

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

WHDA, LLP

Correspondent Name:

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