Serial Number:
75807675
Mark:
AWIS-300
Status:
Cancelled-Section 8
Status Date:
05-26-2007
Filing Date:
Registration Number:
2379493
Registration Date:
08-22-2000
Substrate inspection system, comprising non contact optical scanning equipment and associated software for inspecting semiconductor wafers and for detecting and classifying surface defects on wafers, namely, particles and scratches, polishing defects, crystal orientation defects, roughness, edge chips and cracks
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
05-30-2000
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
N/A
Business Name:
WEINGARTEN, SCHURGIN, GAGNEBIN
Correspondent Name:
