AFS-300
associated with 41 other trademarks
Substrate inspection systems, comprising computer hardware and associated software for measurement of substrates, namely, semiconductor wafers, to det...

Words that describe this trademark:

computer hardware software  hardware software  inspection systems  software measurement  semiconductor wafers  systems  substrate  comprising  measurement  substrates 

Serial Number:

75808283

Mark:

AFS-300

Status:

Cancelled-Section 8

Status Date:

05-26-2007

Filing Date:

Registration Number:

2379499

Registration Date:

08-22-2000

Goods and Services:

Substrate inspection systems, comprising computer hardware and associated software for measurement of substrates, namely, semiconductor wafers, to determine wafer flatness, shape, thickness Bow Wrap and SORI, resistivity, conductivity and notch detection

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

05-30-2000

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

WEINGARTEN SCHURGIN GAGNEBIN ET AL.

Correspondent Name:

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