Serial Number:
75808283
Mark:
AFS-300
Status:
Cancelled-Section 8
Status Date:
05-26-2007
Filing Date:
Registration Number:
2379499
Registration Date:
08-22-2000
Substrate inspection systems, comprising computer hardware and associated software for measurement of substrates, namely, semiconductor wafers, to determine wafer flatness, shape, thickness Bow Wrap and SORI, resistivity, conductivity and notch detection
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
05-30-2000
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
N/A
Business Name:
WEINGARTEN SCHURGIN GAGNEBIN ET AL.
Correspondent Name: