|Z| PROBE
associated with 39 other trademarks
probes for testing integrated circuits, semiconductors, and RF power devices; probes for the measurement of electronic signals; probes for testing int...

Words that describe this trademark:

rf power devices  power devices  integrated circuits  measurement electronic  devices  probes  testing  circuits  semiconductors 

Serial Number:

86692437

Mark:

|Z| PROBE

Status:

Section 8-Accepted

Status Date:

11-27-2023

Filing Date:

Registration Number:

5102901

Registration Date:

12-20-2016

Goods and Services:

probes for testing integrated circuits, semiconductors, and RF power devices; probes for the measurement of electronic signals; probes for testing integrated circuits, namely, waveguide probes for on-wafer probing of circuits

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

10-04-2016

Mark Drawing Status:

4

Abandon Date:

N/A

Business Name:

3000 EL CAMINO REAL, SUITE 5-400

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